The following have been published as a result of the 23IND12 ADAM project and can also be accessed via the Zenodo ADAM community:
Didonè, L., Catalucci, S., Savio, E. (2026). Quantifying surface roughness-induced deviations in dimensional measurements: Comparison and compensation between chromatic confocal distance sensing and tactile probing. CIRP Journal of Manufacturing Science and Technology, 69, 2026, Pages 516-527, https://doi.org/10.1016/j.cirpj.2026.07.014
Didonè, L., Catalucci, S., Savio, E. (2026). Surface roughness influence on chromatic confocal dimensional measurements. Proceedings 26th euspen International Conference and Exhibition, June 8-12, 2026. https://www.euspen.eu/knowledge-base/ICE26230.pdf
Heißelmann, D., et al., (2026). Analysis of measurement uncertainty contributions of optical sensors for the development of digital-metrological twins in coordinate metrology. Proceedings 26th euspen International Conference and Exhibition, June 8-12, 2026. https://www.euspen.eu/knowledge-base/ICE26171.pdf
Linkeová, I., et al., (2026). Glossary of terms and definitions of digital metrological twins for freeform metrology. Proceedings 26th euspen International Conference and Exhibition, June 8-12, 2026. https://www.euspen.eu/knowledge-base/ICE26143.pdf
Mollaei Ardestani, A. et al., (2026). Data-Driven Framework for Machine Learning-Based Uncertainty Evaluation in Coordinate Measuring Machines. Proceedings 26th euspen International Conference and Exhibition, June 8-12, 2026. https://www.euspen.eu/knowledge-base/ICE26193.pdf
van Dijk, M. et al., (2025). Metrological Validation of a Digital Model for a CMM including Digital Bias Correction. Proceedings 2025 IMEKO TC-6 International Conference on Metrology and Digital Transformation - M4DConf 2025 Benevento, Italy, September 3-5, 2025. https://imeko.net/publications/tc6-2025/IMEKO-TC6-2025-038.pdf
Schmelter, S., Fortmeier, I., Heißelmann, D. (2025). Metrology for Virtual Measuring Instruments Illustrated by Three Applications. Metrology, 5(3), 54. https://doi.org/10.3390/metrology5030054